The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2005

Filed:

Jan. 30, 2003
Applicants:

Johnny W. Johnson, Duncan, OK (US);

Ronnie G. Morgan, Waurika, OK (US);

Inventors:

Johnny W. Johnson, Duncan, OK (US);

Ronnie G. Morgan, Waurika, OK (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N011/14 ; G01N011/16 ;
U.S. Cl.
CPC ...
Abstract

A conventional Couette viscometer is transformed to measure yield point, also known as yield stress, and other rheology of various fluids, including ones with particulates. A rotating viscometer includes a driven portion, a responsive body, a standard spring, and a plurality of fins. The fins have predetermined shapes such that the rotating viscometer and the standard spring, connected to the responsive body having at least a portion of the fins, are sensitive to detect yield stress of a test fluid composition in response to a selected rotation imparted to the driven portion. A method of measuring yield stress includes operating a standard rotating viscometer modified with a plurality of intermeshing fins such that a standard spring of the standard rotating viscometer responds to a torque that is related to yield stress and that is imposed by a stressed test material on a portion of the fins connected to the spring.


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