The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2005
Filed:
Sep. 02, 2003
Hun Seo, Yongin-si, KR;
Jin Hong Kim, Yongin-si, KR;
Chang Ho Lee, Goyang-si, KR;
Tae Hee Jeong, Seongnam-si, KR;
Keum Cheol Kwak, Seoul, KR;
Hun Seo, Yongin-si, KR;
Jin Hong Kim, Yongin-si, KR;
Chang Ho Lee, Goyang-si, KR;
Tae Hee Jeong, Seongnam-si, KR;
Keum Cheol Kwak, Seoul, KR;
LG Electronics Inc., Seoul, KR;
Abstract
An apparatus and method for testing mechanical endurance of a surface of an optical disc are disclosed. The apparatus includes a rotating plate, on which an optical disc to be scratched is loaded, for rotating the loaded optical disc, and a plurality of abrasion wheels of a predetermined type, disposed at a perpendicular to the rotating plate, for contacting the optical disc and generating the scratch, the scratch being generated when the optical disc rotates a predetermined number of turns, e.g., a maximum of 5 turns for the abrasion wheels to apply a predetermined load on the optical disc.