The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2005

Filed:

Dec. 01, 2003
Applicants:

Richard E. Wahler, St. James, NY (US);

Eileen M. Marando, Bellmore, NY (US);

Steven Burstein, Smithtown, NY (US);

Wayne A. Miller, Port Jefferson Station, NY (US);

Inventors:

Richard E. Wahler, St. James, NY (US);

Eileen M. Marando, Bellmore, NY (US);

Steven Burstein, Smithtown, NY (US);

Wayne A. Miller, Port Jefferson Station, NY (US);

Assignee:

Standard Microsystems Corporation, Hauppauge, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
F25D017/00 ; H02P001/00 ; G05B005/00 ;
U.S. Cl.
CPC ...
Abstract

A system and method for increasing resolution of pulse width modulated (PWM) signal duty cycle calculations in a fan speed control system operating to control rotational speed of at least one fan. The method may comprise obtaining a temperature reading from a first temperature sensor in the fan speed control system during a first time period. The temperature reading has resolution of a first number of bits. A portion of the first number of bits is selected for calculating a PWM signal duty cycle with the resolution of the first number of bits in the temperature reading using only the portion of the first number of bits and zone parameters associated with the first temperature sensor. The PWM signal duty cycle may then be converted into a PWM signal that may be provided to the at least one fan.


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