The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2005
Filed:
Aug. 27, 2002
Miron Abramovici, Berkeley Heights, NJ (US);
John M. Emmert, Dayton, OH (US);
Charles E. Stroud, Charlotte, NC (US);
Miron Abramovici, Berkeley Heights, NJ (US);
John M. Emmert, Dayton, OH (US);
Charles E. Stroud, Charlotte, NC (US);
Agere Systems Inc., Allentown, PA (US);
University of North Carolina at Charlotte, Charlotte, NC (US);
Abstract
A method of fault tolerant operation of an adaptive computing system includes identifying a faulty resource in a signal path of the adaptive computing system, reconfiguring the signal path to avoid the faulty resource, estimating a time delay created by reconfiguring the signal path, and adjusting a system clock period to accommodate the time delay. In a preferred embodiment, an FPGA is configured into an initial self-testing area and a working area. Resources located within the self-testing area are tested and faulty resources identified. The FPGA is then reconfigured to avoid the identified faulty resources. When the resources are reconfigured for fault tolerant operation, signal path delays may be introduced into the system. If the signal path delays are in a critical path, a period of a system clock may be adjusted in order to insure proper fault tolerant operation.