The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2005
Filed:
Aug. 12, 2003
Applicant:
Akira Hagiwara, Tokyo, JP;
Inventor:
Akira Hagiwara, Tokyo, JP;
Assignee:
GE Medical Systems Global Technology, LLC, Waukesha, WI (US);
Primary Examiner:
Int. Cl.
CPC ...
A61B006/03 ;
U.S. Cl.
CPC ...
Abstract
For the purpose of obtaining an image having a large slice thickness, such as a thickness twice or three times the size of a multi-row detector as measured in the Z'-axis direction, based on raw data collected by an axial scan or helical scan using the detector, raw data (d-d) of three or more adjacent detector rows collected using a multi-row detector () having three or more detector rows are multiplied by cone-beam reconstruction weights (Wi) and Z-filter weights (wi), and are added to obtain one projection datum (Dg). Backprojection processing is applied to the projection datum (Dg) to obtain a pixel datum.