The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2005

Filed:

Aug. 24, 2001
Applicants:

John Anthony Tejada, Garland, TX (US);

Erwin E. Cooper, Valley View, TX (US);

John Paul Schaefer, Plano, TX (US);

Inventors:

John Anthony Tejada, Garland, TX (US);

Erwin E. Cooper, Valley View, TX (US);

John Paul Schaefer, Plano, TX (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B027/10 ;
U.S. Cl.
CPC ...
Abstract

A method for providing optical alignment for a visible wavelength reflective system is provided. The method includes positioning a first mirror blank on a lathe fixture. The first mirror blank comprises a single precision pinhole. The first mirror blank is secured to the lathe fixture. A first mirror is generated from the first mirror blank.


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