The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2005
Filed:
Apr. 24, 2001
Atsushi Ikeda, Hiroshima-ken, JP;
Hiroshi Yamashita, Hiroshima-ken, JP;
Masahiro Yamaguchi, Hiroshima-ken, JP;
Junichi Ibushi, Hiroshima-ken, JP;
Atsushi Ikeda, Hiroshima-ken, JP;
Hiroshi Yamashita, Hiroshima-ken, JP;
Masahiro Yamaguchi, Hiroshima-ken, JP;
Junichi Ibushi, Hiroshima-ken, JP;
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Abstract
A rotational phase difference detecting system, a method that is capable of very accurately detecting a rotational phase difference between a plurality of rotating bodies, a machine operating-state monitoring system, and a method employing the rotational phase difference detecting system. The detecting system has a first rotating body with a first mark, a second rotating body with a second mark, a mark sensor for detecting the first mark, a first camera for imaging the second mark when the mark sensor detects the first mark, and a display section for displaying the second mark imaged by the first camera. The rotational phase difference is detected from a position of an image of the second mark displayed on the display section and is thus detected very accurately with a simple construction comprising the mark sensor, the first camera, and the display section.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile