Automated laser diode test system

Abstract

An automated laser diode testing and burn-in system is disclosed. Initial device data is obtained by applying current to the device at room temperature and measuring the device parameters. The device is then subjected to a burn-in process at higher temperatures. Device performance is monitored throughout the burn-in process. Upon termination of the burn-in process the devices are cooled to room temperature and the post burn-in device power is measured again under the same test conditions. If the device parameters have changed by more than a particular amount the device is rejected. Otherwise, the device is accepted and installed in the next level assembly. The test system disclosed herein achieves significant advantages over prior art in cost and throughput by combining an easy to load laser test fixture with automatic device hold down feature, heating capability, computer program driven test protocol capable of performing initial laser measurements, calibrating each laser and photodetector pair, burn-in test, post burn-in measurements, failed device detection, storage of laser test history records and enabling remote access to such records. The invention eliminates the need for numerous labor intensive ergonomically difficult steps and costly test fixtures.