The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2005
Filed:
Nov. 05, 2003
Karl Joseph Bois, Fort Collins, CO (US);
David W. Quint, Fort Collins, CO (US);
Michael Tsuk, Arlington, MA (US);
Brian Kirk, Amherst, NH (US);
Karl Joseph Bois, Fort Collins, CO (US);
David W. Quint, Fort Collins, CO (US);
Michael Tsuk, Arlington, MA (US);
Brian Kirk, Amherst, NH (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A system and method for determining the dielectric properties associated with a substrate. In one embodiment, a network analyzer measures scattering parameters for at least two lines of substantially identical cross-section embedded within the substrate over a specified frequency range. A first engine determines a complex propagation constant based on the scattering parameters and defines the complex propagation constant in terms of an attenuation component and a phase component. A second engine, responsive to the phase component, determines a relative permittivity parameter associated with the substrate over the specified frequency range. A third engine, responsive to the attenuation component and the relative permittivity parameter, performs a least squares analysis to determine a loss tangent parameter associated with the substrate over the specified frequency range.