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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6873146 B1

PDFFull Text
Date of Patent:
Mar. 29, 2005

Filed:

Mar. 12, 2003

Integrated circuit testing device and a method of use therefor

Applicant:

Jin Liu, Lewisville, TX (US);

Inventor:

Jin Liu, Lewisville, TX (US);

Assignee:

Texas Instruments Incorporated, Dallas, TX (US);

Attorneys:

Yingsheng Tung

Wade James Brady, III

Frederick J. Telecky, Jr.

Primary Examiner:

Minh N Tang

Int. Cl.
CPC ...
G01R031/26 ;
U.S. Cl.
CPC ...
Abstract

The present invention provides an integrated circuit testing deviceand a method of using the same. In one particular embodiment, the integrated circuit testing device may include a first circuit layerlocated over a semiconductor substrate, wherein the first circuit layerhas a second circuit layerlocated thereover. The integrated circuit testing deviceof the same embodiment may further include a signal bond padselectively connectable to each of the first and second circuit layersto test at least one device on each of the first and second circuit layers

Find Patent Forward Citations

Liu, Jin. (2005). Integrated circuit testing device and a method of use therefor (U.S. Patent No. 6873146). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6873146

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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