The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2005

Filed:

Mar. 20, 2002
Applicants:

Alexander Makarov, Cheshire, GB;

Mark E. Hardman, Manchester, GB;

Jae C. Schwartz, San Jose, CA (US);

Michael W. Senko, Sunnyvale, CA (US);

Inventors:

Alexander Makarov, Cheshire, GB;

Mark E. Hardman, Manchester, GB;

Jae C. Schwartz, San Jose, CA (US);

Michael W. Senko, Sunnyvale, CA (US);

Assignee:

Thermo Finnigan LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D059/44 ;
U.S. Cl.
CPC ...
Abstract

A mass spectrometercomprises an ion sourcewhich generates nebulized ions which enter an ion coolervia an ion source blockIons within a window of m/z of interest are extracted via a quadrupole mass filterand passed to a linear trapIons are trapped in a potential well in the linear trapand are bunched at the bottom of the potential well adjacent an exit segmentIons are gated out of the linear trapinto an electrostatic ion trapand are detected by a secondary electron multiplier By bunching the ions in the linear trapprior to ejection, and by focussing the ions in time of flight (TOF) upon the entrance of the electrostatic trapthe ions arrive at the electrostatic trapas a convolution of short, energetic packets of similar m/z. Such packets are particularly suited to an electrostatic trap because the FWHM of each packet's TOF distribution is less than the period of oscillation of those ions in the electrostatic trap.


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