The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2005
Filed:
Apr. 14, 2003
Rudiger Schlaf, Lutz, FL (US);
Zhifeng F. Ren, Newton, MA (US);
Jianguo Wen, Brookline, MA (US);
David L. Carnahan, Needham, MA (US);
Rudiger Schlaf, Lutz, FL (US);
Zhifeng F. Ren, Newton, MA (US);
Jianguo Wen, Brookline, MA (US);
David L. Carnahan, Needham, MA (US);
University of South Florida, Tampa, FL (US);
Boston College, Chestnut Hill, MA (US);
Nanolab, Inc., Newton, MA (US);
Abstract
A method of producing a branched carbon nanotube (CNT) is disclosed. The branched CNT is used with an atomic force microscope having a cantilever and a tip and that is able to measure a surface of a substrate as well as an undercut feature of the substrate that protrudes from the surface. A catalytic material is deposited onto the tip of the microscope, and the catalytic material is subjected to chemical vapor deposition. This initiates growth of a primary branch of the branched carbon nanotube such that the primary branch extends from the tip. A secondary branch is then introduced to extend from the primary branch and produce the branched carbon nanotube. The primary branch interacts with the surface of the substrate and the secondary branch interacts with the undercut feature.