The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2005

Filed:

Apr. 30, 2003
Applicants:

James P. Wallace, Kent, WA (US);

Robert E. Millen, Federal Way, WA (US);

Gerard V. Bohr, Fountain Valley, CA (US);

Rodney A. Juelfs, Seattle, WA (US);

Inventors:

James P. Wallace, Kent, WA (US);

Robert E. Millen, Federal Way, WA (US);

Gerard V. Bohr, Fountain Valley, CA (US);

Rodney A. Juelfs, Seattle, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F019/00 ; G01B007/16 ;
U.S. Cl.
CPC ...
Abstract

A system remotely collects test data from a test platform using platform attached sensors. Identification chips, each having a unique identification code, are each paired with an associated sensor to form sensor/chip pairs. At least one patch panel having a plurality of connections is positioned approximate to the platform. Connections are communicatively linked to each of the sensor/chip pairs. A computer system is communicatively linked to additional patch panel connections. The identification of selected sensors is queried by a computer command to the patch panels, and a group of sensors for a given test is identified and selected. Test data from each of the selected sensors is transferred through the patch panels to the computer system for collation and generation of a test setup compatible with a data acquisition system. Test setup information is downloaded to the data acquisition system in preparation for the next test.


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