The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2005
Filed:
May. 13, 2003
Applicants:
Hisayuki Matsumoto, Hachioji, JP;
Yoichiro Okumura, Hino, JP;
Toshiaki Ishimaru, Hino, JP;
Inventors:
Assignee:
Olympus Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B007/00 ;
U.S. Cl.
CPC ...
Abstract
A shutter abnormality detection apparatus for a camera includes a shutter including leading and trailing curtains which are shutter curtains electrically controlled to run. A curtain run detection unit detects a run state of at least one of the leading and trailing curtains. A curtain run time judgment unit judges a run time of the shutter curtains based on an output from the curtain run detection unit. An abnormality processing unit notifies an abnormality state of the shutter curtains, when it is judged as a result of judgment in the curtain run time judgment unit that the curtain run time is abnormal.