The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6870958 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 22, 2005

Filed:

May. 04, 2001
Applicants:

Akira Murakawa, Toyonaka, JP;

Hirotomo Ishii, Toyonaka, JP;

Chiho Kawakami, Tondabayashi, JP;

Inventors:

Akira Murakawa, Toyonaka, JP;

Hirotomo Ishii, Toyonaka, JP;

Chiho Kawakami, Tondabayashi, JP;

Assignee:

Minolta Co., Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K009/66 ;
U.S. Cl.
CPC ...
Abstract

An image processor detects a specified pattern defined by arrangement of three or more elements. Positions of a plurality of element candidates are detected based on input image data, and n pairs (n≧2) of element candidates are selected in the plurality of elements. Then, n arrangement criterions are determined based on the positions of the selected n pairs, and one arrangement criterion is determined based on the n arrangement criterions. By using the one arrangement criterion, positions of all the elements are calculated in the specified pattern. The specified pattern is detected based on the calculated positions of the arrangement.


Find Patent Forward Citations

Murakawa, Akira. (2005). Image processor for detecting specified pattern (U.S. Patent No. 6870958). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6870958

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