The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2005
Filed:
Nov. 14, 2002
Applicants:
Hamed Sari-sarraf, Lubbock, TX (US);
Eric F. Hequet, Lubbock, TX (US);
Ajay Pai, Bloomington, MN (US);
Inventors:
Hamed Sari-Sarraf, Lubbock, TX (US);
Eric F. Hequet, Lubbock, TX (US);
Ajay Pai, Bloomington, MN (US);
Assignee:
Texas Tech University System, Lubbock, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N023/06 ;
U.S. Cl.
CPC ...
Abstract
A cotton sample is subjected to noninvasive x-ray microtomographic image analysis in order to recognize cotton contaminants in the cotton sample. The cotton contaminants are detected and classified using an x-ray microtomographic system. Once the cotton contaminants in the cotton sample are detected and classified, the cotton sample may be graded based on the type and amount of cotton contaminants present.