The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2005
Filed:
Apr. 15, 2003
Sifang Wu, Savage, MN (US);
Ghasi R. Agrawal, Sunnyvale, CA (US);
Kevin R. Leclair, Prior Lake, MN (US);
Sifang Wu, Savage, MN (US);
Ghasi R. Agrawal, Sunnyvale, CA (US);
Kevin R. LeClair, Prior Lake, MN (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
A memory having built-in self repair with row shifting is provided. The rows in the memory are divided into smaller row groups and a bad row group is repaired with a redundant row group. Each row group receives a row select signal, which is fed into a shift circuit for the row group and a shift circuit for an adjacent row group. A shift circuit is provided for the redundant row group and the shift circuit for the redundant row group receives the row select signal for only the adjacent row group. If a bad row group is detected, then starting with the row group furthest from the redundant row group, the shift circuit for each row group before the bad row group is deactivated. The row group select signal and word line signal for the bad row group are disabled. The shift circuit for the bad row group and the shift circuit for each row group after the bad row group are activated. Therefore, the bad row group is disabled and the redundant row group fills the void.