The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2005

Filed:

Oct. 27, 2003
Applicants:

Jerome L. Elkind, Richardson, TX (US);

Anita A. Strong, Richardson, TX (US);

Andreas Hühmer, Mountain View, CA (US);

Inventors:

Jerome L. Elkind, Richardson, TX (US);

Anita A. Strong, Richardson, TX (US);

Andreas Hühmer, Mountain View, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N027/26 ; G01N021/76 ;
U.S. Cl.
CPC ...
Abstract

Disclosed is apparatus and method for controlled surface plasmon resonance analysis having a surface plasmon resonance sensor () with a derivatized surface plasmon layer () in optical communication with the sensor, derivatizing the surface plasmon layer and placing an analyte detection chamber () in fluid communication with the derivatized surface plasmon layer. The chamber is adapted () for the generation of a molecular interaction bias across the chamber. A conjugate is provided between an analyte and a bias responsive element, wherein the analyte is reactive with the derivatized surface plasmon layer and the bias responsive element changes the response of the analyte to the molecular interaction bias. A conjugated analyte may be introduced into the chamber, generating a molecular interaction.


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