The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2005

Filed:

Mar. 14, 2001
Applicants:

Stefan Burger, Munich, DE;

Rainer Duebel, Baldham, DE;

Inventors:

Stefan Burger, Munich, DE;

Rainer Duebel, Baldham, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B011/00 ;
U.S. Cl.
CPC ...
Abstract

A method and device are for monitoring electric components in a pick-and-place device for substrates. The underside of a pick-up is monitored by an optical scanner during the pick-up phase and during the placing phase of a component. A lift drive for the pick-up is provided with a position sensor that is linked with a control device. The scanner emits and receives a scanning beam oriented transversally to the direction of lift and is likewise coupled with the control device, thereby allowing monitoring of the underside of the pick-up in a direct time-related manner with the picking and placing of the component. The various lift positions are saved and compared when a threshold value of the received scanning beam is exceeded so that the inventive device also allows for a monitoring of the height of the component.


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