The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2005
Filed:
May. 29, 2003
Mark L. Faupel, Alphretta, GA (US);
Shabbir B. Bambot, Suwanee, GA (US);
Tim Harrell, Norcross, GA (US);
J. David Farquhar, Commerce, GA (US);
Glenn S. Arche, Duluth, GA (US);
Walter R. Sanders, Duluth, GA (US);
Edward L. Kimbrell, Buford, GA (US);
Mark L. Faupel, Alphretta, GA (US);
Shabbir B. Bambot, Suwanee, GA (US);
Tim Harrell, Norcross, GA (US);
J. David Farquhar, Commerce, GA (US);
Glenn S. Arche, Duluth, GA (US);
Walter R. Sanders, Duluth, GA (US);
Edward L. Kimbrell, Buford, GA (US);
Spectrx, Inc., Norcross, GA (US);
Abstract
An apparatus embodying the invention includes a probe head with an interrogation surface that is intended to be positioned adjacent or pushed into contact with a target material or tissue. The probe head is constructed to have a plurality of interrogation devices arranged across the face of the interrogation surface. The probe head is also constructed so that the interrogation device can conform to a non-uniform or non-planar surface of the target tissue. In some embodiments, the interrogation surface may have a particular shape that conforms to the shape of a target material. In other embodiments, one or more portions of the interrogation surface could be movable with respect to the remaining portions so that the interrogation surface could be movable with respect to remaining portions so that the interrogation surface can thereby conform to a non-uniform surface. In still other embodiments, a plurality of separately moveable interrogation devices can be arranged across the interrogation surface. During a measurement process, the interrogation surface would be pressed into contact with the non-uniform surface to cause individual ones of the interrogation devices to move, thereby causing the probe head to conform to the non-uniform surface.