The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2005

Filed:

May. 07, 2002
Applicants:

Andrew D. Struckhoff, Alexandria, VA (US);

Eric S. Mosser, Alexandria, VA (US);

William E. Shaw, Milan, MI (US);

Inventors:

Andrew D. Struckhoff, Alexandria, VA (US);

Eric S. Mosser, Alexandria, VA (US);

William E. Shaw, Milan, MI (US);

Assignee:

DCS Corporation, Alexandria, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N021/00 ;
U.S. Cl.
CPC ...
Abstract

A system and method for detecting defects in a material in a liquid bath, the system including a light that illuminates the material through the liquid bath, at least one camera with a view of the material through the liquid bath, and a digital processor in communication with the at least one camera. The at least one camera transmits image data to the digital processor and the digital processor analyzes the image data to identify defects in the material. In an embodiment of the invention, the system includes an anti-turbulence interface through which the at least one camera views the material.


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