The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2005
Filed:
Feb. 18, 2003
Applicants:
Volker Kilian, München, DE;
Richard Roth, Unterhaching, DE;
Inventors:
Volker Kilian, München, DE;
Richard Roth, Unterhaching, DE;
Assignee:
Infineon Technologies AG, Munich, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K019/173 ;
U.S. Cl.
CPC ...
Abstract
To generate test signals by a test logic unit on a semiconductor wafer, the test signals being used to check specific functions and/or parameters of an integrated circuit on the semiconductor wafer, at least two test signals are provided substantially simultaneously by the test logic unit and are subsequently serialized to generate a multiplexed test signal sequence with a data rate required for testing.