The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2005
Filed:
May. 03, 2002
Michael P. Harris, Garland, TX (US);
Michael P. Harris, Garland, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A system includes a support member and a computer system. The support member holds and retains a probe card, which has an array of probe tips extending therefrom. The computer system includes a software program. The software causes the computer system to perform a method including the following. A position where electrical contact occurs between at least some of the probe tips of the probe tip array and a selected surface is determined through testing. Data for the positions where electrical contact occurs is recorded. The recorded data is sorted for a shortest distance where electrical contact occurred between each probe tip tested and the selected surface during the testing. The sorted data group is plotted on a three dimensional cartesian coordinate system. The system may be used for evaluating the planarity of the probe tip array and parallelism of the probe tip array relative to the selected surface.