The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2005
Filed:
May. 16, 2002
Applicants:
Melanie W. Cole, Churchville, MD (US);
Gary L. Katulka, Forrest Hill, MD (US);
Inventors:
Melanie W. Cole, Churchville, MD (US);
Gary L. Katulka, Forrest Hill, MD (US);
Assignee:
The United States of America as represented by the Secretary of the Army, Washington, DC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R031/302 ;
U.S. Cl.
CPC ...
Abstract
A test apparatus and method is provided for dynamic thermal and electrical fatigue testing of a semiconductor in an operating environment, such as air, that mimic thermal and electrical stress in the semiconductor during high power switching in the operating environment. Comparisons of pre- and post-testing electrical measurements, i.e., current, voltage and contact resistance, are combined to provide an indicator or long-term reliability.