The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2005
Filed:
Feb. 28, 2002
BO U. Curry, Redwood City, CA (US);
Andreas N. Dorsel, Menlo Park, CA (US);
Kyle J. Schleifer, Los Gatos, CA (US);
Debra A. Sillman, Los Altos, CA (US);
Bo U. Curry, Redwood City, CA (US);
Andreas N. Dorsel, Menlo Park, CA (US);
Kyle J. Schleifer, Los Gatos, CA (US);
Debra A. Sillman, Los Altos, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A maximum sensitivity optical scanning system is disclosed. It finds use in a variety of applications, including the reading of biopolymeric arrays. It operates by scanning sample at a setting selected to result in signal saturation for some, but not all available data. Subsequent scans of the same area are taken at lower sensitivity settings (in terms of detector gain and/or excitation light source gain or attenuation) and data from at least the previously saturated regions is obtained. If system sensitivity is set too low to produce useful results, optional features may adjust sensitivity upward and follow with an increased sensitivity scan as a remedial measure. Full signal sensitivity is better preserved as most needed in taking data for the weakest signals first with the high-level scan. Data for sample producing stronger signals that can better tolerate photobleaching is then taken in one way or another.