The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2005

Filed:

May. 02, 2001
Applicants:

Gerald Steven Deeb, Mendota Heights, MN (US);

Douglas Adelbert Devens, Jr., Saint Paul, MN (US);

Dennis Louis Krueger, Hudson, WI (US);

Marcia Christine Nichols, Hutchinson, MN (US);

Inventors:

Gerald Steven Deeb, Mendota Heights, MN (US);

Douglas Adelbert Devens, Jr., Saint Paul, MN (US);

Dennis Louis Krueger, Hudson, WI (US);

Marcia Christine Nichols, Hutchinson, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B027/32 ;
U.S. Cl.
CPC ...
Abstract

The present invention discloses methods of controlling the puncturability, and optionally the sealability (the ability of a film to conform around a puncturing object) and resealability (the ability of a film to close a hole made by a puncturing object), of polymeric films. Systems comprising a film and puncturing object are also disclosed. Puncturability is controlled by achieving targeted levels of the friction between the film and a puncturing object, the film's flexural rigidity, the film's recovering stress, and the film's elongation at break.


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