The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2005
Filed:
May. 29, 2003
Yoon Young Kim, Seoul, KR;
Seung Hyun Cho, Yeosu, KR;
Young Kyu Kim, Seoul, KR;
Woo Chul Kim, Suwon, KR;
Yoon Young Kim, Seoul, KR;
Seung Hyun Cho, Yeosu, KR;
Young Kyu Kim, Seoul, KR;
Woo Chul Kim, Suwon, KR;
Abstract
Disclosed is an apparatus or a method for measuring flexural waves and/or vibrations acting on ferromagnetic materials or ferromagnetic films. The present invention includes a bias magnet disposed around the ferromagnetic material so as to form a magnetic field in accordance with a stress distribution pattern occurring as the flexural wave propagates along the above said ferromagnetic material, and a measuring device for measuring the time-varying change of the magnetic induction resulting from the propagation of flexural waves on the ferromagnetic material. In addition to the above components, the bias yoke can be disposed around the ferromagnetic material to support the function of the magnet and the formation of the magnetic circuit as a measuring device for the change of the magnetic induction. In addition, a fixed electromagnet can be used as the bias magnet.