The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2005
Filed:
Oct. 03, 2000
Gary S. Ditlow, Garrison, NY (US);
Robert A. Proctor, South Burlington, VT (US);
Gary S. Ditlow, Garrison, NY (US);
Robert A. Proctor, South Burlington, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for testing the compliance of a distribution of I/O circuits in a semiconductor chip with voltage (IR) and electromigration (EM) limits. Maximum and average currents for the I/O circuits are calculated. A resistance model for the power distribution network of the chip is created, and the I/O circuit currents are indexed to corresponding nodes in the resistance model. Average current demand of the logic circuitry of the chip is also calculated and indexed to nodes in the resistance model. The resistance model with indexed currents is then solved to determine voltages at the nodes. The voltages are checked for compliance with IR and EM limits, and a report is produced. If violations of the IR and EM limits are detected, the placement of the I/O circuits in the power distribution network may be revised to bring the design into compliance with IR and EM requirements.