The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2005

Filed:

May. 03, 1999
Applicants:

Sandra Freedman Feldman, Niskayuna, NY (US);

Andrew Joseph Poslinski, Schenectady, NY (US);

Harsha Mysore Hatti, Schenectady, NY (US);

Craig Alan Cantello, Schenectady, NY (US);

James Louis Cifarelli, Schenectady, NY (US);

Kena Kimi Yokoyama, Latham, NY (US);

Grigoriy Aleksandrovich Shmigol, Cohoes, NY (US);

Hua Wang, Niskayuna, NY (US);

James Paul Barren, Scotia, NY (US);

Arthur Joseph Osborn, Catskill, NY (US);

Inventors:

Sandra Freedman Feldman, Niskayuna, NY (US);

Andrew Joseph Poslinski, Schenectady, NY (US);

Harsha Mysore Hatti, Schenectady, NY (US);

Craig Alan Cantello, Schenectady, NY (US);

James Louis Cifarelli, Schenectady, NY (US);

Kena Kimi Yokoyama, Latham, NY (US);

Grigoriy Aleksandrovich Shmigol, Cohoes, NY (US);

Hua Wang, Niskayuna, NY (US);

James Paul Barren, Scotia, NY (US);

Arthur Joseph Osborn, Catskill, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F017/10 ;
U.S. Cl.
CPC ...
Abstract

A spatially-resolved spectrometer is used to measure streaking in molded sample plastic parts produced using a molding tool with various mold inserts which produce certain desired topological surface features upon these sample plastic parts. The measurements from one or more of these sample plastic parts are then provided to a computerized device which appropriately filters the data and calculates overall data shape, average peak and valley shift, and a quality number indicative of data slopes. These calculations are then used to determine an optimum set of ingredients and processing conditions to be used for the full-scale plastic part production.


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