The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2005

Filed:

Jul. 05, 2000
Applicant:

Mark V. Lane, San Diego, CA (US);

Inventor:

Mark V. Lane, San Diego, CA (US);

Assignee:

RFMD WPAN, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L025/06 ;
U.S. Cl.
CPC ...
Abstract

A novel method and apparatus for calibrating DC offsets in a direct conversion receiver. The present DC offset calibration method and apparatus comprises a direct conversion receiver equipped with a frequency shifter means and a DC offset measurement and correction technique. In accordance with the present invention, DC offsets are calibrated in direct conversion receivers through an inventive method including two steps: a DC offset measurement step and a DC offset correction step. In the DC offset measurement step the frequency of a local oscillation signal (typically generated by a voltage-controlled oscillator (VCO)) is shifted by a selected frequency shift value during the inactive time intervals of the receiver. DC offsets are measured while the frequency of the down-conversion oscillation signal is shifted by the frequency shift value. Before the inactive time interval expires, the frequency of the down-conversion oscillator signal is shifted back to its original value. In the DC offset correction step of the present invention incoming signals are corrected using a correction means that removes the DC offset measured during the DC offset measurement step.


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