The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2005

Filed:

Feb. 06, 2003
Applicants:

Gerhard J. Mueller, Berlin, DE;

Ralf Wolleschensky, Schoeten, DE;

Inventors:

Gerhard J. Mueller, Berlin, DE;

Ralf Wolleschensky, Schoeten, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B021/06 ; G02B021/00 ;
U.S. Cl.
CPC ...
Abstract

A microscope is disclosed in which a specimen is arranged between two objectives and can be observed with reflected light as well as with transmitted light. In a microscope with field transmission, two objectives have substantially identical optical characteristics and at least one of the two objectives is followed by a mirror which reflects the light transmitted through the specimen back into itself exactly. In this way, there is twofold transmission through the specimen with optimum illumination of the solid angle. In a laser scanning microscope, there are likewise two objectives with substantially identical optical characteristics and at least one of the objectives is followed by a phase-conjugating or adaptive mirror.


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