The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2005
Filed:
Mar. 31, 2000
Paul Kadlec, Vail, AZ (US);
Paul Kadlec, Vail, AZ (US);
Hinds Instruments, Hillsboro, OR (US);
Abstract
A diagnostic system () for a PEM () provides optically determined information about the retardance characteristics induced by the PEM (). The diagnostic system () is integrated with the PEM () so that the PEM () performance may be diagnosed or monitored during operation of the PEM (). Specifically, the diagnostic system () is used alongside an optical setup () that employs a primary light beam () for conventional purposes such as polarimetry, optical metrology, etc. The diagnostic system () includes its own diagnostic light source () that is directed through the optical element () of the PEM () at a location remote from the primary aperture () of the PEM (). Thus, the diagnostic system () and the primary PEM () operation can be undertaken simultaneously, with one not interfering with the other. The output of the diagnostic system reflects the actual retardance characteristic provided by the PEM () and can be used as feedback to adjust the PEM control as needed.