The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2005

Filed:

Jan. 02, 2003
Applicants:

Phillip G. Wapner, Palmdale, CA (US);

Wesley P. Hoffman, Palmdale, CA (US);

Inventors:

Phillip G. Wapner, Palmdale, CA (US);

Wesley P. Hoffman, Palmdale, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C021/06 ; G01N013/00 ;
U.S. Cl.
CPC ...
Abstract

A liquid to solid material surface contact angle measurement system operating by way of detecting a transition in the behavior of a liquid sample with the solid material in a changing angular confinement environment along with use of a mathematical algorithm to then determine contact angle. Measurement of the angle at which the tested liquid transitions between apparent wetting and apparent non-wetting behavior, regardless of whether the liquid and solid material are truly classified as wetting or non-wetting, provides a measurement from which disclosed mathematical algorithms can predict the surface wetting characteristics of the liquid on the solid material. Automated performance of the confinement environment measurement and examples are included.


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