The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2005

Filed:

Sep. 16, 2003
Applicant:

Paul Murtagh, Duluth, GA (US);

Inventor:

Paul Murtagh, Duluth, GA (US);

Assignee:

Integrated Device Technology, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L007/06 ;
U.S. Cl.
CPC ...
Abstract

Delay-locked loops have high bandwidth locking characteristics that are less susceptible process, voltage and temperature (PVT) variations. These DLLs are configured to support transition from a partial feedback loop lock condition to a full feedback loop lock condition during a start-up time interval, in order to insure that a multi-cycle lock condition is established at the time the DLL's clock signal output becomes available. The DLL may include a variable delay line that is responsive to a reference clock signal, an auxiliary phase detector that is electrically coupled to the variable delay line, and a main phase detector that is responsive to the reference clock signal and a feedback clock signal (DLLCLK). The auxiliary phase detector may be an edge-triggered SR-type phase detector and the main phase detector may be a three-state phase frequency detector.


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