The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2005

Filed:

Apr. 01, 2002
Applicants:

Wolfgang Ernst, Munich, DE;

Gunnar Krause, Munich, DE;

Justus Kuhn, Munich, DE;

Jens Luepke, Munich, DE;

Jochen Mueller, Munich, DE;

Peter Poechmueller, Colchester, VT (US);

Michael Schittenhelm, Poing, DE;

Inventors:

Wolfgang Ernst, Munich, DE;

Gunnar Krause, Munich, DE;

Justus Kuhn, Munich, DE;

Jens Luepke, Munich, DE;

Jochen Mueller, Munich, DE;

Peter Poechmueller, Colchester, VT (US);

Michael Schittenhelm, Poing, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R031/28 ; G06F011/00 ;
U.S. Cl.
CPC ...
Abstract

Test data generator for generating test data patterns for the testing of a circuit having a frequency multiplication circuit, which increases a low clock frequency of an input clock signal received by a test unit with a specific clock frequency multiplication factor. Also provided is a plurality of data registers for storing test data words read from the data registers, and multiplexer that switches through a test data word read from a data register with the high clock frequency of the output clock signal to a data bus in a way dependent on a register selection control datum of a multi-position register selection control data vector.


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