The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2005

Filed:

Jun. 29, 2001
Applicants:

Gavin G. Gibson, Westminster, CO (US);

Sam Gibson, Egham, GB;

Yuan Zhang, Broomfield, CO (US);

Inventors:

Gavin G. Gibson, Westminster, CO (US);

Sam Gibson, Egham, GB;

Yuan Zhang, Broomfield, CO (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F011/00 ;
U.S. Cl.
CPC ...
Abstract

Methods, systems and programs for isolating faults in a network loop are described. A single write and multiple read test is performed on the last device in a network loop to determine whether the link between the last device and the initiator is a faulty link. A multiple write test is performed on the last device to determine whether the loop segment between the initiator and the last device includes at least one faulty link. If a write error is identified, then the low level error counters of each network device are monitored. The network device with the updated error counter is identified such that the device before that network device in the network loop is selected as the first test device to be used in isolating a faulty link between the initiator and the last device.


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