The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2005
Filed:
May. 21, 2004
Donald K. Frerichs, Shaker Heights, OH (US);
Roman P. Chaws, Windsor Locks, CT (US);
Donald K. Frerichs, Shaker Heights, OH (US);
Roman P. Chaws, Windsor Locks, CT (US);
ABB Inc., Raleigh, NC (US);
Abstract
A preferred process for evaluating the performance of a process control system comprises generating a first set of data comprising a plurality of measurements of a first parameter controlled by the process control system and generating a second set of data comprising a plurality of measurements of a second parameter controlled by the process control system. A preferred process also comprises calculating a first statistical index from the first set of data using a statistical process control method, calculating a second statistical index from the second set of data using the statistical process control method, and combining the first and second statistical indices to produce a performance index representative of the performance of the process control system at controlling the first and second parameters.