The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2005
Filed:
Dec. 27, 2002
Katsuhiko Ueki, Tokyo, JP;
Humitaka Tamura, Kanagawa, JP;
Wataru Okamoto, Kanagawa, JP;
Masayuki Hirayama, Kanagawa, JP;
Katsuhiko Ueki, Tokyo, JP;
Humitaka Tamura, Kanagawa, JP;
Wataru Okamoto, Kanagawa, JP;
Masayuki Hirayama, Kanagawa, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
One of log analysis methods of the present invention includes the step of executing a program a plurality of times; executing a program a plurality of times; the step of generating a plurality of logs, each log being recorded a plurality of events occurring upon the execution of the program according to an occurrence order of each of the events in each of the logs; the step of performing a first calculation to calculate an event occurrence probability, for the occurrence order of each event, based on at least one from the program description concerning each event recorded in the logs and the data to be used upon the execution of the program description; and the step of outputting information concerning an event which corresponds to a characteristic included in the logs, based on the event occurrence probability.