The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2005
Filed:
Jun. 26, 2003
Quinton Lyon, Peterborough, CA;
Perry Dirkx, Peterborough, CA;
Quinton Lyon, Peterborough, CA;
Perry Dirkx, Peterborough, CA;
Siemens Milltronics Process Instruments, Inc., Ontario, CA;
Abstract
A pulse offset calibration method for a pulse-echo level measurement system. The pulse-echo level measurement system includes a transducer for transmitting calibration acoustic pulses and receiving echo pulses. A receiver converts the echo pulses into corresponding pulse profile signals having a leading edge. A static delay interval is defined on the leading edge corresponding to the time interval between the reception of the echo pulse and the response by the receiver. A dynamic delay interval is defined on the leading edge corresponding to the time response characteristics of the transducer and the receiver. The static delay interval and the dynamic delay interval are summed to determine the offset time interval for the echo pulse. The offset time interval is subtracted from the measurements to provide the true duration for the time of flight.