The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2005
Filed:
May. 04, 2000
Applicant:
Dieter Tanzer, Ober-Ramstadt, DE;
Inventor:
Dieter Tanzer, Ober-Ramstadt, DE;
Assignee:
Merck Patent GmbH, Darmstadt, DE;
Primary Examiner:
Int. Cl.
CPC ...
G01N021/00 ; G01N021/47 ;
U.S. Cl.
CPC ...
Abstract
A method and a device for the measurement of turbidity in liquids is described, the measurement taking place by reflectometry. Reflectometers into which a cell and a diffuse reflector can be introduced are used. A method for the measurement of turbidity is described, for example for in-process controls or quality controls, which requires significantly less complex equipment than the conventional methods.
Tanzer, Dieter. (2005). Measuring turbidities by reflectometry (U.S. Patent No. 6864985). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6864985
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile