The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2005
Filed:
Feb. 25, 2003
Kurt Giger, Rüthi, CH;
Kurt Giger, Rüthi, CH;
Leica Geosystems AG, Heerbrugg, CH;
Abstract
The invention relates to a method for measuring distances, based on the phase measurement of an optical measuring beam that is reflected or scattered by an object, on which the beam is sighted. According to said method, the measurement object is exposed to an optical measuring beam of modulated intensity emitted by a measuring device and is converted into electrical measurement signals. The signals are then compared with a reference signal that is generated from the detection and conversion of a portion of measuring light that has been guided on a known reference trajectory, in order to determine the distance between the measuring device and the measurement objet, based on the phase difference that has been determined. The emitted measuring beam is modulated in bursts and the measurement signal of the receiver is only evaluated during the active burst period. The invention also relates to devices for carrying out said method.