The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2005
Filed:
Aug. 27, 2002
Robert A. Meek, Ponca City, OK (US);
Phil D. Anno, Ponca City, OK (US);
Robert A. Meek, Ponca City, OK (US);
Phil D. Anno, Ponca City, OK (US);
Comoco Phillips Company, Houston, TX (US);
Abstract
Conventional migration of short offset seismic data is performed. An interval velocity is obtained using, for example, check shots. An initial model of effective anellipticity parameter as a function of depth is obtained by flattening long offsets within a common image point. From these, interval anellipticity and horizontal velocity are obtained as a function of time. These initial models are used for anisotropic imaging. Any remaining residuals are used to update the interval anellipticity model and the process of migration is repeated until satisfactory results are obtained.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile