The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2005

Filed:

Jan. 10, 2002
Applicants:

David D. Crouch, Corona, CA (US);

William E. Dolash, Montclair, CA (US);

Inventors:

David D. Crouch, Corona, CA (US);

William E. Dolash, Montclair, CA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q015/14 ;
U.S. Cl.
CPC ...
Abstract

An optically transparent dielectric reflector () that reflects an incident millimeter-wave beam at a design frequency. The reflector () includes layers of different optically transparent dielectric materials. The thickness of the individual layers is chosen so that the transmitted waves cancel almost completely in the forward direction, yielding a high degree of transmission loss and substantial reflection. In the preferred embodiment, the invention is comprised of alternating layers of optical sapphire and air. In the best mode, there are seven sapphire layers, with outer sapphire layers () having a nominal thickness of 70.8 mils, inner sapphire layers () with a nominal thickness of 30.4 mils, and air layers have a nominal thickness of 32.0 mils Vented metal spacers () are used to maintain optimal thickness of air layers.


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