The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2005
Filed:
Mar. 24, 2004
Hiroshi Sakayori, Sagamihara, JP;
Takanori Komuro, Tokyo, JP;
Hiroshi Sakayori, Sagamihara, JP;
Takanori Komuro, Tokyo, JP;
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractorfor being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver, an integratorfor being supplied with an analog signal outputted from the adder or subtractor, a switchfor selectively transmitting an analog signal outputted from the integratorand a digital signal outputted from the integrated circuit to the comparator, and a switchfor selectively transmitting a signal outputted from a memoryand a signal outputted from a comparatorto the driver. At least one of the switchesis operated depending on whether a signal to be tested is analog or digital.