Semiconductor integrated circuit with negative voltage generation circuit, test method for the same, and recording device and communication equipment having the same

Abstract

A semiconductor integrated circuit is provided in which a negative voltage generation circuit capable of supplying a memory cell transistor substrate with a stable negative voltage, independently of the fluctuation of a power source voltage or environmental conditions and the process conditions etc., is realized easily, and in which the data holding time of a memory can be secured sufficiently, and the power consumption is reduced. A voltage detection part-B included in the negative voltage generation circuit is provided with a constant voltage generation circuit-B, a measuring voltage generation circuit-B, which receives a constant voltage STDVOUT sent from the constant voltage generation circuit via a voltage supplying circuit-Band a negative voltage VBB sent from a negative voltage generation part and converts it into a measuring voltage REFVby resistors R', R′, a first comparator AMPwhich compares the measuring voltage sent from the measuring voltage generation circuit with ground voltage and outputs the result of comparison, and an output buffer circuit-B′, which amplifies the compared output from the first comparator and outputs it to the negative voltage generation part.