The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2005
Filed:
Aug. 31, 2000
Youqi Wang, Atherton, CA (US);
Peijun Cong, San Jose, CA (US);
Tony N. Wheeler, Santa Clara, CA (US);
Lynn Thomas Van Erden, Livermore, CA (US);
H. Sam Bergh, San Francisco, CA (US);
Youqi Wang, Atherton, CA (US);
Peijun Cong, San Jose, CA (US);
Tony N. Wheeler, Santa Clara, CA (US);
Lynn Thomas Van Erden, Livermore, CA (US);
H. Sam Bergh, San Francisco, CA (US);
Symyx Technologies, Inc., Santa Clara, CA (US);
Abstract
A sampling probe for delivering a reactant to a substance deposited on a substrate to form a reaction product and for transporting the reaction product to a product analyzer for analysis. The probe includes a tip positionable over the substance on the substrate. The probe has a recess in the tip sized and shaped for receiving at least a portion of the reaction product. The probe has a product sampling passage extending from the recess adapted for connection to the product analyzer for transporting the portion of the reaction product to the product analyzer. Further, a reactant delivery passage extends to an outlet at the recess for delivering reactant to the substance on the substrate to form the reaction product.