The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2005

Filed:

Feb. 06, 2002
Applicants:

Vladimir Didenko, Houston, TX (US);

David Baskin, Houston, TX (US);

Inventors:

Vladimir Didenko, Houston, TX (US);

David Baskin, Houston, TX (US);

Assignee:

Baylor College of Medicine, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q001/68 ; G01N001/30 ; G01N033/48 ; C07H021/02 ; C07H021/04 ;
U.S. Cl.
CPC ...
Abstract

Several types of DNA cuts are used as markers of apoptosis for detection of apoptotic cells in situ. The present invention includes a method to detect DNase II type DNA damage, bearing 5'OH using vaccinia topoisomerase I. The present invention also includes a method combining a ligase-based method to detect DNase I type DNA damage and the topoisomerase based method, resulting in simultaneous detection of two specific types of DNA damage in situ.


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