The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2005
Filed:
Sep. 28, 2001
John M. Moran, Mebane, NC (US);
Eric R. Vook, Durham, NC (US);
John M. Moran, Mebane, NC (US);
Eric R. Vook, Durham, NC (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
A method and system for pseudo-random testing a fault tolerant network for determining the network's response to failure includes generating an image of the network on a host. At least one path of the network is selected to be physically failed through the use of a random number generator such that the selection is done pseudo-randomly. The part is then failed and the network's response to the failure is detected and all attempts to repair the failure logged up to and including the first successful attempt to repair the failure. In the event of a failure to repair a path occurs, the test is stopped, a repair effected, and the test restarted at the point the failure to repair occurred.