The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2005
Filed:
May. 16, 2001
Hideaki Yamagata, Kanagawa, JP;
Michiyoshi Tachikawa, Kanagawa, JP;
Toshio Miyazawa, Tokyo, JP;
Hiroshi Shimura, Kanagawa, JP;
Miwa Kawano, Tokyo, JP;
Hideaki Yamagata, Kanagawa, JP;
Michiyoshi Tachikawa, Kanagawa, JP;
Toshio Miyazawa, Tokyo, JP;
Hiroshi Shimura, Kanagawa, JP;
Miwa Kawano, Tokyo, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An image detecting method comprises the steps of: a) searching for a pattern satisfying a predetermined commencement requirement by scanning an input image; b) using the pattern as a starting point, with referring to a dictionary storing therein distances between the center line and an edge of a detection target semicircle, determining for each of a predetermined number of main scan lines along a sub-scan direction whether or not a predetermined edge pattern occurs within a respective range of the distance of the dictionary; and c) determining a detection of the semicircle when the number of error lines on which the predetermined edge pattern does not occur within the respective range of the distance of the dictionary is less than a predetermined threshold.