The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2005
Filed:
Jun. 17, 2002
Karithik Balakrishnan, Albany, NY (US);
Danny L. Mcneil, Greenville, AL (US);
Martin Herke Oyevaar, Goes, NL;
Claude Tinney, Montgomery, AL (US);
Cornelis Adrianus Maria Van Gool, Roosendaal, NL;
Anthony Warren, Evansville, IN (US);
Xiaolin Wu, Ithica, NY (US);
Mingjie Zhu, Evansville, IN (US);
Karithik Balakrishnan, Albany, NY (US);
Danny L. McNeil, Greenville, AL (US);
Martin Herke Oyevaar, Goes, NL;
Claude Tinney, Montgomery, AL (US);
Cornelis Adrianus Maria van Gool, Roosendaal, NL;
Anthony Warren, Evansville, IN (US);
Xiaolin Wu, Ithica, NY (US);
Mingjie Zhu, Evansville, IN (US);
General Electric Company, Schenectady, NY (US);
Abstract
Disclosed herein are processes for detecting the location of an interface between phases. In one embodiment, the process comprises: introducing a reaction mixture into a vessel wherein the reaction mixture is the product of an at least two phase interfacial reaction, and a difference in densities between at least two of the phases is less than or equal to about 1 g/cc, separating the reaction mixture into the phases with an interface located therebetween, measuring electrical inductance of the reaction mixture at different latitudinal locations; and determining the location of the interface.